珠寶玉石檢測中的X熒光光譜法

當下珠寶(bao)玉石(shi)(shi)行(xing)業，X熒(ying)(ying)(ying)光(guang)(guang)(guang)光(guang)(guang)(guang)譜(pu)(pu)(pu)(pu)法是(shi)(shi)珠寶(bao)玉石(shi)(shi)鑒定(ding)的(de)(de)(de)主要手(shou)段之(zhi)一(yi)。X射(she)(she)線(xian)(xian)熒(ying)(ying)(ying)光(guang)(guang)(guang)光(guang)(guang)(guang)譜(pu)(pu)(pu)(pu)技術在樣品的(de)(de)(de)主要成(cheng)(cheng)分(fen)(fen)無(wu)損(sun)(sun)定(ding)量(liang)(liang)和定(ding)性分(fen)(fen)析上得到(dao)(dao)廣泛(fan)應用，成(cheng)(cheng)為貴金屬飾品檢(jian)測(ce)領(ling)域的(de)(de)(de)重要手(shou)段。X射(she)(she)線(xian)(xian)作為一(yi)種電磁輻射(she)(she)，波(bo)長介于紫外線(xian)(xian)和射(she)(she)線(xian)(xian)之(zhi)間，這(zhe)種電磁輻射(she)(she)波(bo)長沒有(you)嚴格(ge)的(de)(de)(de)界(jie)限，隨著(zhu)探測(ce)技術的(de)(de)(de)發展，用X射(she)(she)線(xian)(xian)熒(ying)(ying)(ying)光(guang)(guang)(guang)光(guang)(guang)(guang)譜(pu)(pu)(pu)(pu)進行(xing)定(ding)量(liang)(liang)分(fen)(fen)析，已經成(cheng)(cheng)為了元素(su)分(fen)(fen)析的(de)(de)(de)重要手(shou)段。X熒(ying)(ying)(ying)光(guang)(guang)(guang)光(guang)(guang)(guang)譜(pu)(pu)(pu)(pu)法在當今珠寶(bao)玉石(shi)(shi)行(xing)業檢(jian)測(ce)中得到(dao)(dao)了廣泛(fan)應用，這(zhe)一(yi)方法對(dui)寶(bao)石(shi)(shi)不會(hui)造成(cheng)(cheng)損(sun)(sun)傷，同(tong)時也(ye)能夠(gou)提(ti)高(gao)檢(jian)測(ce)效率(lv)。使用X射(she)(she)線(xian)(xian)照射(she)(she)被(bei)測(ce)物(wu)，被(bei)測(ce)物(wu)激發出不同(tong)波(bo)長的(de)(de)(de)熒(ying)(ying)(ying)光(guang)(guang)(guang)X射(she)(she)線(xian)(xian)，用儀器對(dui)波(bo)長不同(tong)的(de)(de)(de)X射(she)(she)線(xian)(xian)進行(xing)接收分(fen)(fen)離(li)，從(cong)而判(pan)斷其中的(de)(de)(de)組(zu)成(cheng)(cheng)元素(su),對(dui)組(zu)成(cheng)(cheng)元素(su)含量(liang)(liang)具體分(fen)(fen)析，檢(jian)測(ce)出珠寶(bao)玉石(shi)(shi)是(shi)(shi)否是(shi)(shi)合成(cheng)(cheng)和有(you)無(wu)經過優化(hua)處理等。X熒(ying)(ying)(ying)光(guang)(guang)(guang)光(guang)(guang)(guang)譜(pu)(pu)(pu)(pu)儀利用這(zhe)一(yi)原(yuan)理進行(xing)檢(jian)測(ce)，有(you)能量(liang)(liang)色散型X熒(ying)(ying)(ying)光(guang)(guang)(guang)光(guang)(guang)(guang)譜(pu)(pu)(pu)(pu)儀、波(bo)長色散型X熒(ying)(ying)(ying)光(guang)(guang)(guang)光(guang)(guang)(guang)譜(pu)(pu)(pu)(pu)儀之(zhi)分(fen)(fen)。

X熒光(guang)(guang)光(guang)(guang)譜(pu)法(fa)在(zai)珠(zhu)寶(bao)(bao)(bao)玉(yu)(yu)石(shi)(shi)(shi)(shi)(shi)檢(jian)(jian)(jian)(jian)測(ce)(ce)(ce)(ce)(ce)中(zhong)(zhong)(zhong)應用(yong)廣泛(fan)，其主(zhu)要優(you)(you)勢(shi)(shi)(shi)體現在(zai)分(fen)析(xi)(xi)速(su)(su)度(du)(du)、檢(jian)(jian)(jian)(jian)測(ce)(ce)(ce)(ce)(ce)對象、分(fen)析(xi)(xi)密度(du)(du)等(deng)多方(fang)面。X射線在(zai)珠(zhu)寶(bao)(bao)(bao)玉(yu)(yu)石(shi)(shi)(shi)(shi)(shi)檢(jian)(jian)(jian)(jian)測(ce)(ce)(ce)(ce)(ce)中(zhong)(zhong)(zhong)不會(hui)對珠(zhu)寶(bao)(bao)(bao)玉(yu)(yu)石(shi)(shi)(shi)(shi)(shi)造成損壞，與其他檢(jian)(jian)(jian)(jian)測(ce)(ce)(ce)(ce)(ce)方(fang)式相比(bi)具有優(you)(you)勢(shi)(shi)(shi)，同時也是對檢(jian)(jian)(jian)(jian)測(ce)(ce)(ce)(ce)(ce)質量(liang)(liang)的有效保障。X熒光(guang)(guang)光(guang)(guang)譜(pu)儀分(fen)析(xi)(xi)速(su)(su)度(du)(du)快(kuai)，在(zai)整個珠(zhu)寶(bao)(bao)(bao)玉(yu)(yu)石(shi)(shi)(shi)(shi)(shi)檢(jian)(jian)(jian)(jian)測(ce)(ce)(ce)(ce)(ce)上僅僅需要幾分(fen)鐘就可以完成對一件(jian)(jian)珠(zhu)寶(bao)(bao)(bao)玉(yu)(yu)石(shi)(shi)(shi)(shi)(shi)元素含量(liang)(liang)的檢(jian)(jian)(jian)(jian)測(ce)(ce)(ce)(ce)(ce)，檢(jian)(jian)(jian)(jian)測(ce)(ce)(ce)(ce)(ce)速(su)(su)度(du)(du)極快(kuai)，在(zai)實際珠(zhu)寶(bao)(bao)(bao)檢(jian)(jian)(jian)(jian)測(ce)(ce)(ce)(ce)(ce)中(zhong)(zhong)(zhong)體現出明顯的效率優(you)(you)勢(shi)(shi)(shi)。X熒光(guang)(guang)光(guang)(guang)譜(pu)技(ji)(ji)術對檢(jian)(jian)(jian)(jian)測(ce)(ce)(ce)(ce)(ce)對象的形狀(zhuang)、形態(tai)等(deng)條件(jian)(jian)沒有局限(xian)性(xing)(xing)，X熒光(guang)(guang)光(guang)(guang)譜(pu)儀在(zai)珠(zhu)寶(bao)(bao)(bao)玉(yu)(yu)石(shi)(shi)(shi)(shi)(shi)檢(jian)(jian)(jian)(jian)測(ce)(ce)(ce)(ce)(ce)工作中(zhong)(zhong)(zhong)不會(hui)受寶(bao)(bao)(bao)石(shi)(shi)(shi)(shi)(shi)形狀(zhuang)、化學(xue)結合狀(zhuang)態(tai)等(deng)條件(jian)(jian)影響，適用(yong)性(xing)(xing)廣泛(fan)。X熒光(guang)(guang)光(guang)(guang)譜(pu)技(ji)(ji)術在(zai)珠(zhu)寶(bao)(bao)(bao)玉(yu)(yu)石(shi)(shi)(shi)(shi)(shi)檢(jian)(jian)(jian)(jian)測(ce)(ce)(ce)(ce)(ce)中(zhong)(zhong)(zhong)的分(fen)析(xi)(xi)精(jing)密度(du)(du)，這是電磁輻射在(zai)珠(zhu)寶(bao)(bao)(bao)玉(yu)(yu)石(shi)(shi)(shi)(shi)(shi)檢(jian)(jian)(jian)(jian)測(ce)(ce)(ce)(ce)(ce)中(zhong)(zhong)(zhong)的優(you)(you)勢(shi)(shi)(shi)，這種物理分(fen)析(xi)(xi)方(fang)法(fa)對檢(jian)(jian)(jian)(jian)測(ce)(ce)(ce)(ce)(ce)物中(zhong)(zhong)(zhong)元素的化學(xue)性(xing)(xing)質分(fen)析(xi)(xi)有很(hen)高的效率，隨著現代科學(xue)技(ji)(ji)術的飛速(su)(su)發展(zhan)，X熒光(guang)(guang)光(guang)(guang)譜(pu)技(ji)(ji)術在(zai)珠(zhu)寶(bao)(bao)(bao)玉(yu)(yu)石(shi)(shi)(shi)(shi)(shi)檢(jian)(jian)(jian)(jian)測(ce)(ce)(ce)(ce)(ce)領域的應用(yong)會(hui)在(zai)泛(fan)度(du)(du)和深(shen)度(du)(du)上得到(dao)更大發展(zhan)。

X熒光光譜儀在珠寶玉石檢測中的應用

X熒(ying)光光譜(pu)儀在(zai)珠(zhu)(zhu)(zhu)(zhu)寶(bao)(bao)玉(yu)石(shi)檢測中的(de)(de)具體應(ying)用主要(yao)有相似(si)珠(zhu)(zhu)(zhu)(zhu)寶(bao)(bao)玉(yu)石(shi)鑒別(bie)、優化處理珠(zhu)(zhu)(zhu)(zhu)寶(bao)(bao)玉(yu)石(shi)鑒別(bie)、類(lei)質(zhi)同(tong)象珠(zhu)(zhu)(zhu)(zhu)寶(bao)(bao)玉(yu)石(shi)研究等(deng)(deng)幾(ji)個方(fang)面，同(tong)時在(zai)珠(zhu)(zhu)(zhu)(zhu)寶(bao)(bao)玉(yu)石(shi)元素的(de)(de)方(fang)面，從實際檢測數據分析(xi)中可以(yi)驗(yan)證X熒(ying)光光譜(pu)儀在(zai)珠(zhu)(zhu)(zhu)(zhu)寶(bao)(bao)玉(yu)石(shi)檢測上的(de)(de)可行性，這對解決傳(chuan)統檢測手段(duan)無法測出一些珠(zhu)(zhu)(zhu)(zhu)寶(bao)(bao)玉(yu)石(shi)中的(de)(de)元素類(lei)別(bie)、含量等(deng)(deng)問題上有很(hen)大幫助(zhu)。

X熒(ying)光光譜技術(shu)(shu)在(zai)珠寶(bao)(bao)玉(yu)(yu)石(shi)(shi)(shi)無(wu)損檢測(ce)(ce)上的(de)(de)(de)高效(xiao)率(lv)體(ti)(ti)現在(zai)相(xiang)似(si)珠寶(bao)(bao)玉(yu)(yu)石(shi)(shi)(shi)的(de)(de)(de)鑒(jian)定上，從珠寶(bao)(bao)玉(yu)(yu)石(shi)(shi)(shi)的(de)(de)(de)元素組(zu)成上對(dui)相(xiang)似(si)珠寶(bao)(bao)玉(yu)(yu)石(shi)(shi)(shi)進(jin)行(xing)鑒(jian)定和輔助分(fen)析(xi)(xi)。珠寶(bao)(bao)玉(yu)(yu)石(shi)(shi)(shi)原(yuan)料種(zhong)類較(jiao)多，存(cun)(cun)在(zai)性(xing)質相(xiang)似(si)的(de)(de)(de)情況，傳統(tong)檢測(ce)(ce)手段(duan)很難(nan)有(you)精準的(de)(de)(de)檢測(ce)(ce)結果，一些原(yuan)料品種(zhong)在(zai)外觀形(xing)態上很難(nan)區分(fen)，內(nei)部(bu)折射率(lv)和密度也極為(wei)相(xiang)似(si)，在(zai)傳統(tong)檢測(ce)(ce)手段(duan)上存(cun)(cun)在(zai)較(jiao)大難(nan)度，應用X熒(ying)光光譜儀進(jin)行(xing)技術(shu)(shu)分(fen)析(xi)(xi)，對(dui)相(xiang)似(si)珠寶(bao)(bao)玉(yu)(yu)石(shi)(shi)(shi)的(de)(de)(de)內(nei)部(bu)元素含量進(jin)行(xing)更(geng)為(wei)精確(que)的(de)(de)(de)分(fen)析(xi)(xi)，從X射線熒(ying)光光譜圖中可以(yi)很容易區分(fen)出來相(xiang)似(si)珠寶(bao)(bao)玉(yu)(yu)石(shi)(shi)(shi)的(de)(de)(de)不同(tong)之處。這一技術(shu)(shu)在(zai)鑒(jian)別紫晶和紫色方柱石(shi)(shi)(shi)等相(xiang)似(si)類型的(de)(de)(de)寶(bao)(bao)石(shi)(shi)(shi)上有(you)顯著(zhu)的(de)(de)(de)效(xiao)率(lv)優勢。

X熒光(guang)(guang)(guang)(guang)光(guang)(guang)(guang)(guang)譜(pu)儀(yi)對(dui)當(dang)今珠(zhu)(zhu)寶(bao)(bao)(bao)玉(yu)(yu)石(shi)(shi)(shi)行業中優(you)(you)化(hua)處(chu)(chu)(chu)理(li)技(ji)(ji)術(shu)下(xia)(xia)(xia)的寶(bao)(bao)(bao)石(shi)(shi)(shi)也有(you)明顯優(you)(you)勢(shi)，對(dui)優(you)(you)化(hua)處(chu)(chu)(chu)理(li)后(hou)的珠(zhu)(zhu)寶(bao)(bao)(bao)玉(yu)(yu)石(shi)(shi)(shi)進行技(ji)(ji)術(shu)分析，鑒(jian)別(bie)天(tian)(tian)然寶(bao)(bao)(bao)石(shi)(shi)(shi)和(he)人(ren)工(gong)合(he)成技(ji)(ji)術(shu)下(xia)(xia)(xia)的成品(pin)，現代優(you)(you)化(hua)處(chu)(chu)(chu)理(li)技(ji)(ji)術(shu)下(xia)(xia)(xia)出(chu)現的高(gao)仿(fang)珠(zhu)(zhu)寶(bao)(bao)(bao)玉(yu)(yu)石(shi)(shi)(shi)成品(pin)流入珠(zhu)(zhu)寶(bao)(bao)(bao)玉(yu)(yu)石(shi)(shi)(shi)市場，很(hen)容易(yi)迷惑(huo)消(xiao)費者。因(yin)此通過X熒光(guang)(guang)(guang)(guang)光(guang)(guang)(guang)(guang)譜(pu)儀(yi)對(dui)優(you)(you)化(hua)處(chu)(chu)(chu)理(li)技(ji)(ji)術(shu)產生的人(ren)工(gong)合(he)成品(pin)進行鑒(jian)別(bie)，能(neng)夠幫助(zhu)消(xiao)費者識別(bie)優(you)(you)化(hua)處(chu)(chu)(chu)理(li)珠(zhu)(zhu)寶(bao)(bao)(bao)玉(yu)(yu)石(shi)(shi)(shi)與天(tian)(tian)然寶(bao)(bao)(bao)石(shi)(shi)(shi)。珠(zhu)(zhu)寶(bao)(bao)(bao)玉(yu)(yu)石(shi)(shi)(shi)中的紅寶(bao)(bao)(bao)石(shi)(shi)(shi)人(ren)工(gong)合(he)成制(zhi)作過程中采用鉛玻璃(li)填充方法，其效果與天(tian)(tian)然紅寶(bao)(bao)(bao)石(shi)(shi)(shi)相(xiang)似性較高(gao)，X熒光(guang)(guang)(guang)(guang)光(guang)(guang)(guang)(guang)譜(pu)儀(yi)能(neng)夠分辨出(chu)兩者之(zhi)間的差異性，人(ren)工(gong)合(he)成品(pin)中明顯的鉛元素在(zai)X熒光(guang)(guang)(guang)(guang)光(guang)(guang)(guang)(guang)譜(pu)儀(yi)中能(neng)夠較容易(yi)鑒(jian)別(bie)出(chu)來與天(tian)(tian)然紅寶(bao)(bao)(bao)石(shi)(shi)(shi)的細微不同之(zhi)處(chu)(chu)(chu)。寶(bao)(bao)(bao)石(shi)(shi)(shi)優(you)(you)化(hua)處(chu)(chu)(chu)理(li)技(ji)(ji)術(shu)在(zai)X熒光(guang)(guang)(guang)(guang)光(guang)(guang)(guang)(guang)譜(pu)儀(yi)應(ying)用于珠(zhu)(zhu)寶(bao)(bao)(bao)玉(yu)(yu)石(shi)(shi)(shi)檢測后(hou)能(neng)夠更容易(yi)鑒(jian)別(bie)出(chu)來，同時X熒光(guang)(guang)(guang)(guang)光(guang)(guang)(guang)(guang)譜(pu)儀(yi)在(zai)輔助(zhu)分析、鑒(jian)別(bie)合(he)成翡翠、珍珠(zhu)(zhu)等(deng)珠(zhu)(zhu)寶(bao)(bao)(bao)玉(yu)(yu)石(shi)(shi)(shi)方面(mian)也有(you)著明顯優(you)(you)勢(shi)。

X熒光(guang)(guang)光(guang)(guang)譜(pu)(pu)儀(yi)在(zai)珠(zhu)寶(bao)(bao)(bao)(bao)玉石(shi)檢(jian)(jian)(jian)測(ce)中的(de)(de)應(ying)用(yong)還體現在(zai)類(lei)質(zhi)(zhi)同(tong)(tong)象(xiang)(xiang)(xiang)珠(zhu)寶(bao)(bao)(bao)(bao)玉石(shi)方面上(shang)，類(lei)質(zhi)(zhi)同(tong)(tong)象(xiang)(xiang)(xiang)在(zai)珠(zhu)寶(bao)(bao)(bao)(bao)玉石(shi)檢(jian)(jian)(jian)測(ce)中主要(yao)是晶體結構中的(de)(de)離子(zi)、原子(zi)等結構類(lei)型上(shang)的(de)(de)線性(xing)變(bian)化現象(xiang)(xiang)(xiang)，在(zai)這一(yi)現象(xiang)(xiang)(xiang)的(de)(de)檢(jian)(jian)(jian)測(ce)研(yan)究上(shang)確定珠(zhu)寶(bao)(bao)(bao)(bao)玉石(shi)中類(lei)質(zhi)(zhi)同(tong)(tong)象(xiang)(xiang)(xiang)系列(lie)的(de)(de)名稱，能(neng)夠有(you)效提(ti)升珠(zhu)寶(bao)(bao)(bao)(bao)玉石(shi)檢(jian)(jian)(jian)測(ce)的(de)(de)效率(lv)和(he)質(zhi)(zhi)量，這一(yi)過程中X熒光(guang)(guang)光(guang)(guang)譜(pu)(pu)儀(yi)的(de)(de)應(ying)用(yong)有(you)著(zhu)(zhu)重要(yao)作用(yong)，珠(zhu)寶(bao)(bao)(bao)(bao)玉石(shi)中的(de)(de)元素分析和(he)含量統(tong)計分析為類(lei)質(zhi)(zhi)同(tong)(tong)象(xiang)(xiang)(xiang)珠(zhu)寶(bao)(bao)(bao)(bao)玉石(shi)的(de)(de)準確性(xing)檢(jian)(jian)(jian)測(ce)體提(ti)供(gong)了有(you)效的(de)(de)數據幫助。X熒光(guang)(guang)光(guang)(guang)譜(pu)(pu)儀(yi)隨著(zhu)(zhu)X射線熒光(guang)(guang)光(guang)(guang)譜(pu)(pu)技(ji)術(shu)的(de)(de)發(fa)展(zhan)(zhan)(zhan)不(bu)(bu)(bu)斷發(fa)展(zhan)(zhan)(zhan)完善，在(zai)珠(zhu)寶(bao)(bao)(bao)(bao)玉石(shi)鑒(jian)定領域(yu)依靠技(ji)術(shu)手(shou)段提(ti)高(gao)檢(jian)(jian)(jian)測(ce)的(de)(de)效率(lv)，不(bu)(bu)(bu)僅適用(yong)于以上(shang)幾(ji)種珠(zhu)寶(bao)(bao)(bao)(bao)玉石(shi)檢(jian)(jian)(jian)測(ce)情(qing)況(kuang)，隨著(zhu)(zhu)未(wei)來科學技(ji)術(shu)水平的(de)(de)不(bu)(bu)(bu)斷提(ti)高(gao)，珠(zhu)寶(bao)(bao)(bao)(bao)玉石(shi)行(xing)業的(de)(de)發(fa)展(zhan)(zhan)(zhan)也會不(bu)(bu)(bu)斷出現新的(de)(de)發(fa)展(zhan)(zhan)(zhan)方向(xiang)。

日本理學波長色散X射線熒光光譜儀

ZSX Primus IV

1.高度可靠性的上照射式光學系統

ZSX Primus IV具有場新的上(shang)照射(she)式(shi)光(guang)學配置。用戶再也不用擔心由于維護(hu)樣品室導致的路(lu)徑污染或停止時(shi)間。上(shang)照射(she)式(shi)幾何結構消除了清掃的擔心并增加了時(shi)間。

2.高精度樣品定位

高(gao)(gao)精度樣品定位(wei)確保了樣品表面與X設吸(xi)納管(guan)之(zhi)間(jian)的距離恒定。這對例如(ru)合(he)金(jin)分析等需要高(gao)(gao)精度的應用非(fei)常重要。ZSX Primus IV使用一個光學配(pei)置執行(xing)高(gao)(gao)精度分析，用于減少(shao)由(you)于例如(ru)電熔銖和(he)壓片等樣品中的非(fei)平面表面導致的錯誤。

3.SQX 基本參數軟件與EZ掃描軟件

用(yong)戶使(shi)用(yong)EZ掃(sao)描軟(ruan)件(jian)可以(yi)在無需(xu)任(ren)何事先設置即可分析位(wei)置樣品(pin)(pin)。這個節省時間的(de)特征僅需(xu)點擊鼠標(biao)和輸入樣品(pin)(pin)名稱。結(jie)合(he)SQX基本參數(shu)軟(ruan)件(jian)，快速(su)提供最準確的(de)XRF結(jie)果。SQX能夠自(zi)動校正包括線重疊(die)的(de)所有(you)矩陣(zhen)效果。SQX還可以(yi)通(tong)過光電子（輕、超輕元素(su)）、變化的(de)環境、雜質和不同的(de)樣品(pin)(pin)尺(chi)寸校正輔助(zhu)的(de)激發效應。使(shi)用(yong)匹配庫(ku)和掃(sao)描分析程序提高準確性(xing)。